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BEGIN:VEVENT
UID:calendar.44228.field_event_date.0@www.wright.edu
DTSTAMP:20260219T192058Z
CREATED:20151217T214834Z
DESCRIPTION:Applied Statistics: An Overview - Friday\, January 8\, 2016 We 
 will cover: Levels of Measurement Variable Structures Descriptive Statisti
 cs Classification of Statistical Methods Sample Size Determination p-value
  t-test and ANOVA Multiple Regression Logistic Regression Experimental Des
 ign
DTSTART;TZID=America/New_York:20160108T000000
DTEND;TZID=America/New_York:20160108T000000
LAST-MODIFIED:20210813T193603Z
LOCATION:202 Math & Micro
SUMMARY:Seminar - Applied Statistics:  An Overview
URL;TYPE=URI:/events/seminar-applied-statistics-overv
 iew
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